The intermetallic compound Ag 3 Sn is an important component phase present in both dental amalgams [1] and lead-free solders for microelectronic applications [2]. Ag 3 Sn exhibits the D0 a Cu 3 Ti-type structure, which is an ordered orthorhombic form of the HCP structure [3]. The phase is unusually ductile for an intermetallic compound, but there have been very few studies on the defects and deformation mechanisms in Ag 3 Sn due to the difficulty of making high quality single phase samples [4]. Early studies [3] suggested that deformation in Ag 3 Sn can proceed by {011}-type twinning, and this is consistent with the results of micro-hardness indentation studies [5]. In a recent study [6] we characterized defect structures in a Ag 3 Sn-Cu 3 Sn pseudo-binary alloy deformed in compression. A high density of dislocations was generated in the Ag 3 Sn grains, but no deformation twinning was observed. However, the character of these dislocations was not analyzed in detail. In the present study, we have examined the dislocations structures in deformed single-crystal Ag 3 Sn and the operative deformation mechanisms were considered.Single-phase Ag 3 Sn crystals several millimeters in size were produced by a solution growth method [7]. The single-crystal specimens were deformed by bending at room temperature, and the microstructures of the deformed crystals were evaluated using transmission electron microscopy (TEM). Cross-sectional TEM specimens through the (001) free surface were prepared using an FEI Helios Nanolab 460F1 dualbeam focused ion beam (FIB) instrument following the procedures described by Yu et al. [4]. The TEM specimens were examined in an FEI Talos F200X S/TEM operating at accelerating voltage of 200 kV.The deformed Ag 3 Sn crystals contained both twins and dislocations, and particular attention was paid to the character of the dislocations. Figure 1 is a bright-field (BF) TEM image from a typical area in deformed Ag 3 Sn taken under two-beam conditions with g = 040, where g is the reciprocal lattice vector of the diffracting planes. The beam direction is close to [100]. Many parallel dislocations are present, and these extend for up to 1.5 µm within the specimen volume. The average dislocation density was calculated as ρ = 10 9 -10 10 cm -2 based on such images. The Burgers vectors, b, were determined by diffraction contrast analyses using the gb = 0 criterion, and it was found all the segments are edge dislocations having Burgers vectors, b, parallel to [010]. Since the line directions of the defects are approximately [001], this is consistent with deformation on the [010](100) slip system. It is noted that most of the dislocations were present as dislocation pairs, with a separation of up to 30 nm. To determine if these paired dislocations are partial dislocations or dislocation dipoles, BF TEM images were taken with ±g (g = 040), as presented in Figure 2. Significant changes in spacing between these dislocation pairs were noticed on reversing the sign of g. This inside/outside contrast reveals that the...