Microstructural Study of Sintered SiC via High Frequency Ultrasound Spectroscopy

Quantitative analysis of inclusion distributions in hot pressed silicon carbide

“…(1) or a similar function for modeling the defects that participate in fragmentation. Perhaps further development of non-destructive evaluation methods, (NDE) such as high frequency ultrasound spectroscopy, will enable more accurate characterization of the defect distributions [38].…”