2011
DOI: 10.1063/1.3606430
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Microstructure and interface control of GaN/MgAl2O4 grown by metalorganic chemical vapor deposition: Substrate-orientation dependence

Abstract: Low trap states in in situ SiNx/AlN/GaN metal-insulator-semiconductor structures grown by metal-organic chemical vapor deposition Appl. Phys. Lett. 105, 102911 (2014); 10.1063/1.4895677 Aluminum doping induced columnar growth of homoepitaxial ZnO films by metalorganic chemical vapor deposition Appl.

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Cited by 12 publications
(17 citation statements)
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“…MgAl 2 O 4 is a crystal material which has a face-centered cubic unit cell with a lattice parameter of 0.8083 nm and belongs to the Fd3m space group. 29 Fig. 1 illustrates the crystal structure of MgAl 2 O 4 .…”
Section: Mgal 2 Omentioning
confidence: 99%
“…MgAl 2 O 4 is a crystal material which has a face-centered cubic unit cell with a lattice parameter of 0.8083 nm and belongs to the Fd3m space group. 29 Fig. 1 illustrates the crystal structure of MgAl 2 O 4 .…”
Section: Mgal 2 Omentioning
confidence: 99%
“…However, the MgAl 2 O 4 substrate has high partial Mg pressure [83,84]. If MOCVD or MBE is utilized to grow III-nitride films on MgAl 2 O 4 substrates, intense interfacial reaction will take place due to the diffusion of Mg atoms caused by the high growth temperature [86,87]. There is no doubt that interfacial reaction should be eliminated in order to grow high-quality group IIInitride films on MgAl 2 O 4 substrates.…”
Section: Group Iii-nitride Films On Mgal 2 O 4 Substrates By Pldmentioning
confidence: 97%
“…In addition, Mg-Al-O oxides can be used as a substrate for epitaxial growth (Kuramata et al, 1995;Chen et al, 2000;Zeng et al, 2007;He et al, 2010He et al, , 2011Gatel et al, 2013), a catalyst (Feng et al, 2013) and a catalyst support (Li et al, 2013). For example, in order to grow high-quality GaN and ZnO films, MgAl 2 O 4 substrate is generally employed as the lattice mismatch between the substrate and the synthesized films is decreased compared with that of Al 2 O 3 substrate (Kuramata et al, 1995;Chen et al, 2000).…”
Section: Introductionmentioning
confidence: 99%