2013
DOI: 10.1186/1556-276x-8-424
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Microstructure and optical properties of Ag/ITO/Ag multilayer films

Abstract: Transflective and highly conductive Ag/ITO/Ag multilayer films were prepared by magnetron sputtering on glass substrates. The microstructure and optical properties of Ag/ITO/Ag multilayer films were systematically investigated by X-ray diffraction, scanning electron microscopy, and ultraviolet-visible spectroscopy. The optical properties of the multilayer films were significantly influenced by the thickness of the Ag surface layer from 3.0 to 12.6 nm. The multilayer film of Ag9.3nm/ITO142nm/Ag9.3nm shows the b… Show more

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Cited by 4 publications
(3 citation statements)
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“…Thus, it is not the ohmic losses due to electron scattering in silver but the temperature-independent morphology of the silver surface that decides on losses due to scattering into free space [ 2 ]. The above conclusion is in agreement with recently observed maxima in the visible range of the transmittance spectra of Ag/MgF 2 /Ag [ 11 ], Ag/ITO/Ag [ 12 ], and ZnO/Ag/ZnO [ 13 ] multilayers, which clearly depend on Ag surface morphology.…”
Section: Introductionsupporting
confidence: 92%
“…Thus, it is not the ohmic losses due to electron scattering in silver but the temperature-independent morphology of the silver surface that decides on losses due to scattering into free space [ 2 ]. The above conclusion is in agreement with recently observed maxima in the visible range of the transmittance spectra of Ag/MgF 2 /Ag [ 11 ], Ag/ITO/Ag [ 12 ], and ZnO/Ag/ZnO [ 13 ] multilayers, which clearly depend on Ag surface morphology.…”
Section: Introductionsupporting
confidence: 92%
“…Figure 2a displays the X-ray diffraction (XRD) spectra of the Ag-NTF electrodes deposited at 3.0 V. The observed spectra clearly confirmed the cubic facecentered (FCC) phase of Ag-NTF electrodes (JCPDS card # 04−0783). 31 In addition to these peaks, peaks for ITO are also found in the XRD patterns (JCPDS card # 76−1463). No other impurities are observed in the XRD patterns.…”
Section: Structural and Morphologicalmentioning
confidence: 99%
“…Scherrer's equation was taken into consideration to calculate the mean crystallite size, and it was found to be 17 nm. 31 Figure 2b,c shows the optical and field emission scanning electron microscopy (FESEM) images of the Ag-NTF electrode fabricated at 3.0 V. A continuous and uniform film structure is easily visible here. The crystallite size indicates the nanocrystalline nature of the film.…”
Section: Structural and Morphologicalmentioning
confidence: 99%