2017
DOI: 10.1016/j.jeurceramsoc.2016.12.031
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Microstructure characterisation of ceramics via 2D and 3D X-ray refraction techniques

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Cited by 36 publications
(29 citation statements)
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“…Cnormalm/μ is proportional to the amount of inner surfaces that are perpendicular to the scattering vector. Thereby, a simultaneous decrease of Cnormalm/μ in both sample orientations (TBC surface normal parallel and perpendicular to the scattering vector) means that the number of ‘objects’ is reduced, and those objects are either of spherical shape (pores) or of randomly distributed orientation . As mentioned above, in the as‐sprayed condition APS microstructures contain a reasonable amount of pores and cracks in the sub‐micrometer range.…”
Section: Resultsmentioning
confidence: 92%
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“…Cnormalm/μ is proportional to the amount of inner surfaces that are perpendicular to the scattering vector. Thereby, a simultaneous decrease of Cnormalm/μ in both sample orientations (TBC surface normal parallel and perpendicular to the scattering vector) means that the number of ‘objects’ is reduced, and those objects are either of spherical shape (pores) or of randomly distributed orientation . As mentioned above, in the as‐sprayed condition APS microstructures contain a reasonable amount of pores and cracks in the sub‐micrometer range.…”
Section: Resultsmentioning
confidence: 92%
“…Thereby, a simultaneous decrease of C m ∕ in both sample orientations (TBC surface normal parallel and perpendicular to the scattering vector) means that the number of 'objects' is reduced, and those objects are either of spherical shape (pores) or of randomly distributed orientation. 15 As mentioned above, in the as-sprayed condition APS microstructures contain a reasonable amount of pores and cracks in the sub-micrometer range. On operation at elevated temperatures, those features rapidly disappear due to sintering.…”
Section: X-ray Refractionmentioning
confidence: 85%
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“…Apart from carrying an augmented information content, 3D data such as those from X-ray computed tomography, optical tomography or 3D infra-red thermography, allow the use of finite element simulations based on experimentally determined microstructures, or the extraction of quantitative data (e.g., fiber orientation distribution in concrete [ 18 ]) at the scale of a representative volume element (RVE). On top of that, in this Special Issue, the strength of a relatively novel technique, X-ray refraction radiography (see [ 19 ] for an introduction to it) was successfully used to quantify damage in thermally cycled refractory ceramics [ 20 ].…”
mentioning
confidence: 99%