1991
DOI: 10.1016/0921-4534(91)90263-x
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Microstructure of epitaxial YBa2Cu3O7 films on step-edge SrTiO3 substrates

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Cited by 161 publications
(43 citation statements)
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“…This is expected because the (110) facet (in fact ( 101 ) or (011 ) ) has an angle of inclination with respect to the (001) plane equal to 45 °. TEM investigations on such rather steep surface inclinations showed that the YBCO film tend to nucleate a-axis grain on these [9 ].…”
Section: Substratementioning
confidence: 99%
“…This is expected because the (110) facet (in fact ( 101 ) or (011 ) ) has an angle of inclination with respect to the (001) plane equal to 45 °. TEM investigations on such rather steep surface inclinations showed that the YBCO film tend to nucleate a-axis grain on these [9 ].…”
Section: Substratementioning
confidence: 99%
“…Film growth with a tilt angle a between the film c-axis and the surface normal as expected from lattice matching has been confirmed by X-ray diffraction measurements. Epitaxial film grown with unaltered c-axis orientation across low-angle steps on (100) SrTi03 substrates has been reported recently [8] indicating parallel alignment of YBa2Cu307_(f and SrTi03 (100) planes independent of a.…”
Section: S =mentioning
confidence: 99%
“…As in most HTS multilayer circuits, our test samples include crossovers and via connections that require low-angle edges to prevent unwanted grain boundary formation. 12 We have developed a technique for forming such shallow edges using a proximity exposure process suitable for our relatively thick multilayer films. A 2-m-thick positive photoresist layer is exposed in a contact mask aligner using a multistep procedure.…”
Section: ͓S0003-6951͑97͒00534-2͔mentioning
confidence: 99%