1984
DOI: 10.1016/0167-577x(84)90086-7
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Microstructure of Porous silicon and its evolution with temperature

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Cited by 122 publications
(43 citation statements)
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“…Initially, the DIOS surface is characterized as a porous surface with 20 -100 nm pore size (Figure 2a; no laser irradiation). Similar to the reported literature [13], surface melting was observed upon laser irradiation: one pulse of 15 mJ/cm 2 -pulse results in significant surface restructuring (Figure 2b) as characterized by an increase in surface roughness and pore size. The estimated surface area reduction is roughly 30% relative to the original DIOS surface by measuring the porous density in the SEM images.…”
Section: Laser Intensity Surface Restructuring and Dios Activitysupporting
confidence: 72%
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“…Initially, the DIOS surface is characterized as a porous surface with 20 -100 nm pore size (Figure 2a; no laser irradiation). Similar to the reported literature [13], surface melting was observed upon laser irradiation: one pulse of 15 mJ/cm 2 -pulse results in significant surface restructuring (Figure 2b) as characterized by an increase in surface roughness and pore size. The estimated surface area reduction is roughly 30% relative to the original DIOS surface by measuring the porous density in the SEM images.…”
Section: Laser Intensity Surface Restructuring and Dios Activitysupporting
confidence: 72%
“…This high surface area significantly lowers the melting point of silicon; pore coalescence and structural collapse were observed at 900°C [13], whereas bulk silicon melting occurs at 1410°C [14]. The driving force for this melting process is a reduction in surface energy of the porous silicon (0.2 J/cm 2 for porous silicon versus 0.0001 J/cm 2 planar silicon) [13]. In fact, the typical nitrogen laser energy (15 mJ/cm 2 -pulse) commonly used in DIOS is known to induce melting of porous silicon [15].…”
mentioning
confidence: 99%
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“…Increased temperature also increases the extent of oxidation leading to completely oxidized PSi at around 900-1000 • C [43]. Due to the structural expansion, the pore diameter and porosity are dependent on the extent of oxidation, and a drastic drop in the specific surface area has been observed in PSi oxidized above 600 • C. This could be partly avoided by pre-oxidizing PSi first around 300 • C prior to high temperature oxidation [60].…”
Section: Oxidation Of Psimentioning
confidence: 97%
“…Monocrystalline silicon pressure sensor membranes have been previously formed in most cases by anisotropic etching with an electrochemical etch-stop [6]. High-quality monocrystalline silicon membranes are produced using the APSM process using the following process sequence: (a) anodic etching of porous silicon in concentrated hydrofluoric (HF) acid, (b) sintering of porous silicon at temperatures in excess of 400 C in a non-oxidizing environment [7], and (c) subsequent epitaxial growth using the underlying rearranged porous silicon as a single-crystal seed-layer.…”
Section: Surface Micromachiningmentioning
confidence: 99%