Microstructure of SiC fiber fabricated by two-stage chemical vapor deposition on tungsten filament

Zhang, Rongjun; Yang, Yanqing; Shen, Wei; Wang, Chen; X, Luo

doi:10.1016/j.jcrysgro.2010.10.001

Cited by 26 publications

(12 citation statements)

References 16 publications

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“…Therefore, the texture of SiC fibre along the axial direction needs to be further research. In addition, as shown in previous studies, [8][9][10][11] there are two or three concentric sublayers along the radial direction because of the two or three deposition stages during the CVD process. Moreover, the microstructure of SiC fibre, such as the grain size, is different for each concentric sublayer.…”

Section: Introductionsupporting

confidence: 57%

Local texture of three-stage CVD SiC fibre by precession electron diffraction (PED) and XRD

Bin

Yang

et al. 2014

Materials Science and Technology

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SiC fibre with the transverse isotropic properties is very important to it reinforced metal matrix composites. In this paper, local texture of the CVD SiC fibre was investigated by means of X-ray diffraction (XRD) and precession electron diffraction (PED) on transmission electron microscopy (TEM). The result from XRD is in agreement with the result obtained from PED. And the result shown that at the first stage of deposition, the preferred direction of SiC grains is almost random and the distribution of grain size is scattered. At the second and third stages of deposition, there are two kinds of texture in SiC fibre, that is, (110),111. and (110),115.. Furthermore, the grain size at the second and third stages is about 200 nm and it is lower at the third stage than at the second stage because of the lower temperature at the third stage. The [110] preferred direction along axial direction for SiC fibre is beneficial to the axial tensile strength.

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Section: Introductionsupporting

confidence: 57%

Local texture of three-stage CVD SiC fibre by precession electron diffraction (PED) and XRD

Bin

Yang

et al. 2014

Materials Science and Technology

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“…According to the previous results, an interdiffusion layer will be formed between SiC sheath and W-core, consisting of tungsten carbide and silicide. [17][18][19][20] Because of different techniques and conditions employed in preparation, composition of the interdiffusion layer will be slightly different. The interdiffusion layer of CVD W-core SiC fibers by our group is composed of two sub-layers, i.e., hexagonal a-WC (lattice constants a ¼ 2.906 Å and c ¼ 2.837 Å ) and tetragonal W 5 Si 3 (lattice constants a ¼ 9.645 Å and c ¼ 4.970 Å ), arrayed sequentially from the SiC sheath to the W-core, namely, the W/SiC interfacial sequence in the fiber can be described as W/W 5 Si 3 /WC/SiC.…”

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confidence: 99%

First-principles calculation on β-SiC(111)/α-WC(0001) interface

Jin¹,

Yang²,

Li³

et al. 2014

Journal of Applied Physics

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“…[11] In our sample, SiC grains are nano columns with almost same growth direction (β-SiC <111> direction). [2] Thus, the widely used sphere weighting function has no geometrical meaning in our sample. Furthermore, it is often found that Raman features do not differ from that of bulk material unless the dimension is less than typically 30 nm.…”

Section: Resultsmentioning

confidence: 99%

“…In previous research, β-SiC (111) orientation is confirmed as growing preference by X-ray diffraction and TEM. [2] β-SiC <111> is the thickness direction of homogeneous SiC thin film between defects [ Fig. 1(b)].…”

Section: Resultsmentioning

confidence: 99%

“…SiC fiber made by chemical vapor deposition (CVD) is always chosen as reinforcement for the competitive aerospace material titanium matrix composites (TMCs). [1][2][3] It is clear that the microstructure of the SiC fiber has a significant effect on the physical and mechanical properties of fibers and final performance of TMCs. Previous researches on microstructure of CVD SiC fiber were always performed with transmission electron microscopy (TEM).…”

Section: Introductionmentioning

confidence: 99%

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Raman investigation of defective SiC nanocrystals

Zhang

Yang

Ouyang

et al. 2015

J Raman Spectroscopy

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Phonon confinement effect and surface optical mode in SiC nanocrystal have been investigated through Raman spectroscopy. Considering high density of stacking faults in SiC grains, the correlation length of RWL (proposed by Richter, Wang, Li to explain phonon confinement in nano silicon) model is determined as a distance between nearby stacking faults. Thus, homogeneous region becomes thin slices in cylindrical SiC grains, which redefines weighting function. Effect of anisotropy of phonon dispersion curve is also analyzed during calculation. The additional 875-cm À1 band is attributed to defects and amorphous SiC, which is confirmed by transmission electron microscopy. SiC grains are approximated as column array with grain boundary substances regarded as surrounding medium, which explains surface optical phonon mode at 915 cm À1 .

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Microstructure of SiC fiber fabricated by two-stage chemical vapor deposition on tungsten filament

Cited by 26 publications

References 16 publications

Local texture of three-stage CVD SiC fibre by precession electron diffraction (PED) and XRD

Local texture of three-stage CVD SiC fibre by precession electron diffraction (PED) and XRD

First-principles calculation on β-SiC(111)/α-WC(0001) interface

Raman investigation of defective SiC nanocrystals

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