1999
DOI: 10.1002/(sici)1521-396x(199911)176:1<487::aid-pssa487>3.0.co;2-v
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Microstructures of Cubic and Hexagonal GaN Grown on (0001) Sapphire by ECR-MBE with Various Electric Biases

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Cited by 5 publications
(8 citation statements)
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“…A factor which has often been discussed in the literature as a requirement for the stabilization of ZB-GaN on hexagonal substrates is a high Ga/N ratio during growth [7][8][9]12]. In the present work it was shown that ZB-GaN (1 1 1) of high phase purity could be obtained for a Ga/N ratio close to one; the growth surface was Ga-terminated, but there were no excess Ga adatoms contributing to surface reconstructions or droplet formation upon cooling.…”
Section: Article In Presscontrasting
confidence: 99%
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“…A factor which has often been discussed in the literature as a requirement for the stabilization of ZB-GaN on hexagonal substrates is a high Ga/N ratio during growth [7][8][9]12]. In the present work it was shown that ZB-GaN (1 1 1) of high phase purity could be obtained for a Ga/N ratio close to one; the growth surface was Ga-terminated, but there were no excess Ga adatoms contributing to surface reconstructions or droplet formation upon cooling.…”
Section: Article In Presscontrasting
confidence: 99%
“…In other words, these samples can be considered pure ZB (1 1 1) layers, at least within the resolution of the PL technique. This result is in contrast to previous studies of ZB-GaN (1 1 1), where data supporting the phase purity were either not given or else showed worse purity compared to our samples [5][6][7][8][9]. The introduction of a small fraction of WZ inclusions for more Ga-rich growth conditions could be attributed to GaN growth from metallic Ga droplets by a vapor-iquid-solid (VLS) related mechanism [22].…”
Section: Article In Pressmentioning
confidence: 99%
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“…Yang et al [4] attempted an intriguing sequential growth method for h-GaN and c-GaN on GaAs (111) substrates by varying the substrate temperature during growth. In our previous study, cGaN was obtained by changing the electric bias voltages applied to the sapphire (0001) substrates during GaN growth by electron-cyclotron-resonance plasma-excited molecular beam epitaxy (ECR-MBE) [5,6]. The bias voltage-mediated method should have an advantage over the temperature-mediated method because the former is much quicker and simpler than the latter; hence, the bias voltage method has the potential to grow sharp hexagonal and cubic interfaces and superlattice structures.…”
mentioning
confidence: 99%