Reactions of halogens (Cl2,XeF2)
with metals (Cu) and semiconductors (Si, GaAs) are investigated. The main
focus is put on light induced reactions, stimulated by synchrotron radiation in the
spectral range from 200 to 50 nm, in comparison with the dark reaction. Growth of
reaction products on the surface and the desorption of volatile compounds are
studied. A set-up with a quartz microbalance was adopted to determine reaction
rates in situ. The rates are very sensitive to sample preparation. In the system
Cu/Cl2, oxygen was found to especially slow down the reaction and much higher reaction rates
than reported previously were observed for pure samples. Measurements with masks show
the possibility of using desorption (also called light induced dry etching) to microstructure
materials. Analysis of the irradiations with different wavelengths reveals a high spectral
dependence of the reactions, which can therefore be controlled. The efficiency of
the light induced non-selective reaction follows the gas phase absorption of the
etching gases, whereas selective reactions, which are used to structure the materials,
are induced in adsorbed halogens at different wavelengths. High efficiencies of
single-photon events, due to chain reactions, with multiplication factors of the order of
105, are observed. The resulting pit size has to be contrasted with the intended spatial
resolution.