2009
DOI: 10.1016/j.spmi.2008.11.019
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Microwave complementary doped-channel field-effect transistors

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Cited by 2 publications
(3 citation statements)
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“…Apparently, two linear regions appear in the transfer characteristic due to the existence of the two individual channel layers in the depletion-mode device. As compared with the previous InGaP/InGaAs HEMT and DCFET, the studied device exhibits higher drain current, higher transconductance, and larger gate turn-on voltage [3,4].…”
Section: Resultsmentioning
confidence: 76%
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“…Apparently, two linear regions appear in the transfer characteristic due to the existence of the two individual channel layers in the depletion-mode device. As compared with the previous InGaP/InGaAs HEMT and DCFET, the studied device exhibits higher drain current, higher transconductance, and larger gate turn-on voltage [3,4].…”
Section: Resultsmentioning
confidence: 76%
“…GaAs-based heterostructure field-effect transistors (HFETs), such as electron mobility transistors (HEMTs) and doped-channel field effect transistors (DCFETs), have been considered to be the promising devices in signal amplifier, microwave, gas detector, and digital integrated circuits [1][2][3][4][5][6]. As to the HEMTs, though the maximum transconductance value may be relatively high due to the high carrier mobility, the average transconductance was low and they suffered from small gate voltage swing [3].…”
Section: Introductionmentioning
confidence: 99%
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