Abstract. A neural network approach to the inverse scattering problem for microwave tomographic reconstruction is presented. Although the technique of microwave tomography has been developed for more than two decades, it is still in its infancy in that it is necessary to solve the inverse scattering problem, which is well known as an ill-posed and nonlinear problem and therefore difficult to deal with. To improve the inherent ill-posedness of the problem, good regularization procedures are required. In this paper, an edge-preserving regularization is proposed with a set of line processes to preserve the edge of the reconstructed image. Since the unknown dielectric permittivities are continuous complex variables and the line processes are binary variables, an augmented Hopfield network is applied to the mixed-variable optimization problem. With this method, a priori knowledge can be conveniently incorporated into the optimization process, and inversions of large matrices are avoided. A numerical example of a simple model illuminated by the transverse magnetic incident waves is reported, and the advantages and limitations of the method are discussed.
IntroductionAccording the internal characteristics of objects or media and their responses to the incidence of electromagnetic wave to get the properties of the scattering field is called a direct scattering problem. Here, the word "scattering" is a generalized concept, which includes transmission, reflection, refraction, diffraction, and scattering. On the contrary, when the characteristics of objects are unknown, the problem to obtain them in terms of the scattering properties detected by certain devices outside of the objects is called the inverse scattering problem.There are various kinds of electromagnetic waves according to their different frequencies. When the incident radiation comes from microwave, the inverse scattering problem is the so-called microwave tomography, which reconstructs the internal complex permittivity tompographic image of the object from the scattered near-field measurements. The real part of complex permittivity is proportional to the dielectric . Thus it will be competitive with these sophisticated diagnostic methods or be applied as a complementary method. However, microwave tomography is quite difficult to develop to its full potential because the inverse scattering problem is nonlinear and ill-posed. In the sense of Hadamard, ill-posedness means that the solutions of problems cannot satisfy existence, uniqueness, and stability simultaneously.As we all know, if the frequency of the incident wave is high, the relation between the measured data and the internal characteristics of the object is linear. For example, X rays travel along straight lines without diffracting in the object, and then it is relatively easy to