Microwave near-field polarimetry

Lann, A. F.; Golosovsky, M.; Davidov, D.; Frenkel, A.

doi:10.1063/1.124454

Cited by 12 publications

(12 citation statements)

References 11 publications

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“…The SEMP described in Section 3.8 can be used to accurately measure dielectric properties, both the dielectric constant and the loss tangent [167][168][169][170][171][172][173][174]. Theoretical analysis of SEMP shows that the dielectric constant can be calculated from the resonant frequency shift.…”

Section: Dielectric Propertiesmentioning

confidence: 99%

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Combinatorial approaches as effective tools in the study of phase diagrams and composition–structure–property relationships

Zhao

2006

Progress in Materials Science

212

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Section: Dielectric Propertiesmentioning

confidence: 99%

“…The scanning evanescent microwave probe (SEMP) was designed specifically for combinatorial measurements of electrical and dielectric properties [166][167][168][169][170][171][172][173][174]. It has a very broad dynamic range in measuring electrical conductivity, from insulators, to semiconductors, to metals.…”

Section: Electrical Conductivitymentioning

confidence: 99%

Combinatorial approaches as effective tools in the study of phase diagrams and composition–structure–property relationships

Zhao

2006

Progress in Materials Science

212

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“…Lann et al proposed a near-field microwave scanning probe, which allows local polarimetric measurements with a subwavelength spatial resolution (Lann et al 1999). The probe is a symmetrical transmitting/receiving antenna formed by two orthogonal slits at the end plate of a circular waveguide.…”

Section: Cross-slit Probe Methodsmentioning

confidence: 99%

“…The fundamental working principle for a slit aperture as a transmitting/receiving antenna has been discussed in Section 3.6. The probe is fabricated on the surface of a ballshaped polymethyl-methacrylate (PMMA) insert protruding from the end of a circular waveguide (Lann et al 1999). A layer of thick silver film is deposited on the insert through a mask formed by two perpendicularly placed thin varnished wires.…”

Section: Cross-slit Probe Methodsmentioning

confidence: 99%

“…In order to minimize this effect, one may measure the magnitude and phase of the cross-coupling signals in the absence of the sample and in the presence of a homogeneous metallic sample and determine the full cross-coupling matrix. In the analysis of the measurement results of samples under test, the cross-coupling signals can be vectorially subtracted (Lann et al 1999).…”

Section: Cross-slit Probe Methodsmentioning

confidence: 99%

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Measurement of Microwave Electrical Transport Properties

Chen

Ong

Neo

et al. 2004

Microwave Electronics

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MMIC's characterization by very near‐field technique

Nativel¹,

Marchetti²,

Falgayrettes³

et al. 2004

Micro & Optical Tech Letters

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This paper shows a method to characterize microwave circuits using a near-field scanning microscope. Applied on various samples, it shows good resolution and weak disturbance for ICs operating with very common microwave components. Here, it is applied in an industrial INTRODUCTIONToday, in order to increase the MMIC bandwidth, it is necessary to decrease the scale factor down to the micrometer range. Consequently, the characterization of these devices becomes increasingly difficult or impossible. Due to the complexity of the circuit layout, electromagnetic simulators are unusable or ineffective. Some solutions have been proposed: Black et al. [1] built up a radiofrequency bench with a S.QU.I.D. that maps the magnetic field above a sample surface up to a few GHz. Another electromagnetic near-field mapping setup based on an electro-optic probe was proposed by Yang et al. [2] for up to 20 GHz. Keilmann et al. [3] proposed a setup that works in transmission mode with coaxial probes, allowing high-subwavelength resolution to be reached. Other works have been reported in [4 -8], where resonant coaxial line or waveguide was used to determine electromagnetic properties such as dielectric function, near-field polarimetry, or resistivity. Budka et al.[9] presented a modulated perturbation technique, which is an indirect method to map the electromagnetic field: the device under test (D.U.T.) is disturbed by a low-frequency modulated signal in its near-field range. In the work of Y. Gao and I. Wolff [10,11], a collection-scanning setup is proposed to diagnose high-frequencies circuits. These methods are either expensive (electro-optic sampling method), restrictive (low-temperature operation when using the S.QU.I.D., not broadband for resonnant cavities or waveguides, and map-only passive devices), or have a more complex setup (modulated perturbation method, use of a Vector Network Analyzer).In this paper, we present a collection method and a setup to map the electromagnetic near-field of active or passive microwave circuits by miniature coaxial cable, similar to Gao et al., but with no need of a Vector Network Analyzer (VNA) This setup also allows the mapping of the electromagnetic field near a self-emitting sample. It is a relatively simple setup, since it uses only common HF components (such as amplifiers and quadratic detectors). It is also a nondestructive method, as it works without contact to measure the different electromagnetic-field components based on the antennas's shape. The D.U.T. can be as complex as possible; the setup simply collects the electromagnetic near-field above its surface. The resolution reached is about 10 micrometers and the frequency range is from 0.01 to 20 GHz (limited by the amplifiers bandwidth). This paper also presents evaluations of the probe disturbance in the near-field zone for running ICs and industrial applications with this setup. EXPERIMENTAL SETUPThe D.U.T. is placed on a micrometric displacement table driven by a computer (see Fig. 1). This configuration enables us t...

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Microwave near-field polarimetry

Cited by 12 publications

References 11 publications

Combinatorial approaches as effective tools in the study of phase diagrams and composition–structure–property relationships

Combinatorial approaches as effective tools in the study of phase diagrams and composition–structure–property relationships

Measurement of Microwave Electrical Transport Properties

MMIC's characterization by very near‐field technique

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