Microwave surface resistance of epitaxial YBa2Cu3O7 thin films at 18.7 GHz measured by a dielectric resonator technique

Klein, N.; Dähne, U.; Poppe, U.; Tellmann, N.; Urban, K.; Orbach, S.; Hensen, S.; Müller, Günter; Piel, H.

doi:10.1007/bf00618067

Cited by 87 publications

(24 citation statements)

References 19 publications

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“…The microwave surface impedance was determined using a dielectric resonator technique [24], [25]. The sample is placed underneath a dielectric puck.…”

Section: Sample Preparation and Measurment Techniquesmentioning

confidence: 99%

Microwave properties of MgB/sub 2/ thin films

Klein

Jin

Wördenweber

et al. 2003

IEEE Trans. Appl. Supercond.

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“…The microwave surface impedance was determined using a dielectric resonator technique [24], [25]. The sample is placed underneath a dielectric puck.…”

Section: Sample Preparation and Measurment Techniquesmentioning

confidence: 99%

Microwave properties of MgB/sub 2/ thin films

Klein

Jin

Wördenweber

et al. 2003

IEEE Trans. Appl. Supercond.

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“…[14][15][16][17] Krupka et al reported the use of shielded end post dielectric resonators for characterization of ultrathin metal films, including graphene, 18 and discussed the different regimes of conductivity with respect to the resonator response. 19 In our recent contribution, the sheet resistance of a variety of graphene layers on 10 Â 10 mm 2 substrates was determined from the measured quality factor of a closed microwave cavity loaded with a sapphire dielectric puck and the sample under test.…”

Section: Introductionmentioning

confidence: 99%

Contact-free sheet resistance determination of large area graphene layers by an open dielectric loaded microwave cavity

Shaforost

Wang

Goniszewski

et al. 2015

Journal of Applied Physics

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A method for contact-free determination of the sheet resistance of large-area and arbitrary shaped wafers or sheets coated with graphene and other (semi) conducting ultrathin layers is described, which is based on an open dielectric loaded microwave cavity. The sample under test is exposed to the evanescent resonant field outside the cavity. A comparison with a closed cavity configuration revealed that radiation losses have no significant influence of the experimental results. Moreover, the microwave sheet resistance results show good agreement with the dc conductivity determined by four-probe van der Pauw measurements on a set of CVD samples transferred on quartz. As an example of a practical application, correlations between the sheet resistance and deposition conditions for CVD graphene transferred on quartz wafers are described. Our method has a high potential as measurement standard for contact-free sheet resistance measurement and mapping of large area graphene samples.

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“…the increase of the surface impedance Z = R + iX with rf field and therewith the generation of harmonics, limit the application of superconducting rf cavities, not only in HTS communication devices [ 11 but also in rf accelerators [2]. These nonlinearities may occur on slow time scale, such as heating TEomn modes are used to study YBCO films as end-plates in Nb cavities [3] and in A1203 dielectric resonators [4], [5]. With ideal boundary conditions Z = 0 at the metallic walls, the TEom,, field distributions are obtained analytically or by MAFIA yielding eigenfrequency f0=9.…”

Section: Introductionmentioning

confidence: 99%

Power dependencies of the surface impedance of Y-Ba-Cu-O

Halbritter

Numssen

Gaganidze

2001

IEEE Trans. Appl. Supercond.

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Abstruct-The application of HTS is obstructed by the nonlinear behavior of Z(T,f,Hd) with rf field. The study of those nonlinearities profits by carefully calibrated rf measurements in the frequency and time domain, which yield 6Rs(H) = H" = 6Xs(H). In contrast to SRs(H) = H", the ratio r=GXs/GRs is independent of geometry factor and shows distinct T and f dependencies for various mechanisms and rf set-ups. The high power rf response in the frequency domain yields nonlinear resonance curves, n and r values. The time domain measurements give useful insight about dynamics of the underlying nonlinear mechanisms. The results r = 1 and n = 1-2 are in line with Josephson fluxons in weak links, which may interact with dc fluxons threading through the weak links.

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Microwave surface resistance of epitaxial YBa2Cu3O7 thin films at 18.7 GHz measured by a dielectric resonator technique

Cited by 87 publications

References 19 publications

Microwave properties of MgB/sub 2/ thin films

Microwave properties of MgB/sub 2/ thin films

Contact-free sheet resistance determination of large area graphene layers by an open dielectric loaded microwave cavity

Power dependencies of the surface impedance of Y-Ba-Cu-O

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