1963
DOI: 10.1109/proc.1963.2637
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Microwave techniques in the study of semiconductors

Abstract: SummaryApplication of microwave techniques to the study of semiconductors is steadily gaining importance for various reasons. This paper describes some microwave methods for the measurement of semiconductor parameters developed at The theory of conduction in semiconductors at microwave frequencies is first reviewed briefly. A SWR method is then outlined and its application to the study of temperature variation of conductivity and dielectric constant is discussed. An experimental arrangement for the measurement… Show more

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Cited by 20 publications
(1 citation statement)
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“…Non-contact measurements capable of accurately describing the behavior of carrier lifetime in semiconductors using the transmission of microwaves through a sample were first reported in 1959 [7]. Shortly afterwards, several articles reported the ability of a microwave reflectance techniques capable of accomplishing the same goals in 1962-1963 [8][9][10].…”
Section: Microwave Detected Lifetime Measurementsmentioning
confidence: 99%
“…Non-contact measurements capable of accurately describing the behavior of carrier lifetime in semiconductors using the transmission of microwaves through a sample were first reported in 1959 [7]. Shortly afterwards, several articles reported the ability of a microwave reflectance techniques capable of accomplishing the same goals in 1962-1963 [8][9][10].…”
Section: Microwave Detected Lifetime Measurementsmentioning
confidence: 99%