Recent work at ONERA demonstrates the interest of using microwave interferometry associated with the EMIR (ElectroMagnetic-InfraRed) method in non destructive evaluation. Until now the method was based on the doubled-sided configuration which is not always applicable in industrial conditions. A single-sided new interferometric method is presented here which avoids this drawback.
EMIR (ElectroMagnetic-InfraRed) method theoryTo provide a simple means of measuring an electromagnetic (EM) field, ONERA [1,2] has developed a sensor consisting of a thin film whose electrical (or magnetic) properties are such that it converts a part of the incident field into heat. The film is very thin (some tens of microns), which limits the lateral heat conduction, improving the spatial resolution. Its emissivity is chosen to maximize the infrared energy received by the infrared camera.The dissipated volume power density is given by the well-known formula:in which cr is the conductivity of the material, & = &' -j&" its complex permittivity, and Jl = Jl' -jJl" its complex permeability, E and H being the amplitudes of the electric and magnetic incident fields. The resulting temperature rise depends not only on the absorbed energy, but also on the thermal properties of the film and on the heat transfer with the surroundings as well. To decrease the influence of the convection and radiation losses, an amplitude modulation of the EM field associated with a lock-in thermographic detection was proposed [3,4]. This technique increases the dynamic range and the spatial resolution when the modulation frequency is increased, but at the same time the signal-to-noise ratio is degraded. A modulation frequency of 1 Hz is a good compromise.The technique described above only permits amplitude mapping of the EM field. To measure the phase, ONERA has developed since 1994 a holographic method in which two coherent plane waves are interfering, one of them being used as the reference [5,6]. It is a double-sided method, the two needed antennas or the antenna and an EM mirror being respectively on each side of the inspected structure. For NOE, the tested sample is located near of the film. Previous work used both single-sided and double-sided configurations with a unique antenna. These configurations are presented in Fig. 1 and their adequacy for the NOE of various types of EM materials are summarized. They are compared to the new . technique here presented.
Principle of the single-sided interferometric EMIR methodThe single-sided interferometric method consists of generating at the photothermal film located close to the front face of the tested structure interference between two coherent plane waves emitted by two antennas located in front of the structure. The resulting field of interference is then visualized by an infrared camera mapping the film temperature distribution. This film temperature increase is proportional to the intensity of the electric field.