2013
DOI: 10.1063/1.4804675
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Mid-infrared electroluminescence from a Ge/Ge0.922Sn0.078/Ge double heterostructure p-i-n diode on a Si substrate

Abstract: We report the observation of mid-infrared room-temperature electroluminescence from a p-i-n Ge/Ge0.922Sn0.078/Ge double heterostructure diode. The device structure is grown using low-temperature molecular beam epitaxy. Emission spectra under various injection current densities in the range of 318 A/cm2–490 A/cm2 show two distinct profiles peaked at 0.545 eV (2.275 μm) and 0.573 eV (2.164 μm), corresponding to indirect and direct bandgaps of the Ge0.922Sn0.078 active layer, respectively. This work represents a … Show more

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Cited by 114 publications
(67 citation statements)
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“…While stannane SnH 4 is unstable, deuteration increases stability to the point that epitaxy applications become feasible. Long-term storage of SnD 4 for commercial applications has also been demonstrated. 16 The chemistry and applications of group-IV hydrocarbon analogues have been recently reviewed by Rivard.…”
Section: Synthetic Approachmentioning
confidence: 99%
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“…While stannane SnH 4 is unstable, deuteration increases stability to the point that epitaxy applications become feasible. Long-term storage of SnD 4 for commercial applications has also been demonstrated. 16 The chemistry and applications of group-IV hydrocarbon analogues have been recently reviewed by Rivard.…”
Section: Synthetic Approachmentioning
confidence: 99%
“…A number of groups have utilized this approach to fabricate n-Ge/i-Ge 1-y Sn y /p-Ge heterostructure light emitting diodes (LEDs) in which the GeSn active layers are ensconced by p-and n-type Ge electrodes. 4,5,[22][23][24][25] A drawback of such designs, however, is the formation of two defected Ge 1-y Sn y /Ge interfaces that act as carrier recombination sites, adversely affecting the emission efficiency of the devices. Our previous work in this area was focused on the fabrication of enhanced performance LEDs by adopting improved n-Ge/i-Ge 1-y Sn y /p-Ge 1-z Sn z designs containing a single defected interface.…”
Section: Synthetic Approachmentioning
confidence: 99%
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