2006
DOI: 10.1111/j.1551-2916.2006.01356.x
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Migration of Half Partial Dislocations in the Planar Fault Plane of Hexagonal Barium Titanate

Abstract: The prism plane half partials with Burgers vector bPr= 1/3 ×〈0110〉 dissociated from the perfect basal dislocations with bB= 1/3〈1210〉 embedded in an α‐type extended planar stacking fault of hexagonal (h‐)BaTiO3 have been analyzed by transmission electron microscopy. It is found that the dissociation of a series of basal dislocations occurred by glide in the fault plane (0002). However, migrating of the pair partials trailing behind in the fault plane was impeded by the leading pair. Under the applied stress in… Show more

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Cited by 2 publications
(15 citation statements)
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“…This has consequently produced discrepant separations between half‐partials, such as d ≈500 nm determined in the present study and ∼120 nm reported by Eibl et al 8 . and ∼47–195 nm by Wu et al 16 …”
Section: Discussioncontrasting
confidence: 85%
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“…This has consequently produced discrepant separations between half‐partials, such as d ≈500 nm determined in the present study and ∼120 nm reported by Eibl et al 8 . and ∼47–195 nm by Wu et al 16 …”
Section: Discussioncontrasting
confidence: 85%
“…This necessitates climb of partial dislocations upon dissociation in prism planes at the interface of the two stacking faults. One of a pair of half‐partials migrated by a mixed glide in (0002) and climb in has indeed been determined 16 …”
Section: Discussionmentioning
confidence: 93%
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