2008
DOI: 10.1149/1.2908620
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MIMC Reliability and Electrical Behavior Defined by a Physical Layer Properties of the Dielectric

Abstract: Metal-Insulator-Metal Capacitor (MIMC) reliability and electrical properties are defined by the TDDB lifetime, breakdown voltage and leakage current. This article demonstrates the correlation between these electrical properties and the physical properties of the dielectric layer. The intrinsic quality of MIMC capacitors can therefore be predicted before complete processing by measuring a physical property of the MIMC dielectric.

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“…The MaCE can also be applied to semiconductors other than Si, such as Ge, [146][147][148] GaAs, [149][150][151][152][153][154][155][156][157][158][159][160][161][162][163][164] Al x Ga 1−x As, [165] GaN, [166,167] GaP, [168] InP, [169][170][171][172] SiC, [173,174] and Ga 2 O 3 [175] to fabricate various nanostructures. These compound semiconductors find widespread applications in electronics, optoelectronics, and photovoltaics, etc.…”
Section: Mace Of Semiconductors Other Than Simentioning
confidence: 99%
“…The MaCE can also be applied to semiconductors other than Si, such as Ge, [146][147][148] GaAs, [149][150][151][152][153][154][155][156][157][158][159][160][161][162][163][164] Al x Ga 1−x As, [165] GaN, [166,167] GaP, [168] InP, [169][170][171][172] SiC, [173,174] and Ga 2 O 3 [175] to fabricate various nanostructures. These compound semiconductors find widespread applications in electronics, optoelectronics, and photovoltaics, etc.…”
Section: Mace Of Semiconductors Other Than Simentioning
confidence: 99%