Miniature Active Differential Magnetic Field Probe With High Sensitivity for Near-Field Measurements

Wang, Jianwei; Yan, Zhaowen; Liu, Jiawei; Zhou, Yang; Fu, Changshun; Su, D.

doi:10.1109/tap.2021.3111300

Cited by 40 publications

(6 citation statements)

References 19 publications

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“…Probe calibration [3,4] is significant for near field measurement [5,6]. The calibration factor is directly related to the accuracy of many measurements, such as radiated emission measurement [7,8], conducted emissions measurement [9,10], near-field to far-field transformation [11,12], electromagnetic interference source reconstruction [13,14], and so on. In these applications, differential magnetic field probe shows excellent characteristics, so they are widely concerned.…”

Section: Introductionmentioning

confidence: 99%

“…In these applications, differential magnetic field probe shows excellent characteristics, so they are widely concerned. At present, almost all differential magnetic field probes use the traditional calibration method [15][16][17] that is, using a microstrip line or a coplanar waveguide line, but with the increase in the frequency, the accuracy of the calibration factor is difficult to guarantee for differential H-field probe. Therefore, the research on the calibration factor measurement method at high frequency is very significant.…”

Section: Introductionmentioning

confidence: 99%

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Differential magnetic field probe calibration based on symmetric de‐embedding technology

Hou,

Xue,

Ding

et al. 2023

IET Science Measure & Tech

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The de‐embedding calibration method has been proposed to achieve high‐precision calibration for a single port electric field or magnetic field probe, which can effectively eliminate the calibration ripple. However, the method's effectiveness for a four‐port calibration system has not been verified yet. In this paper, a four‐port de‐embedding calibration method with a differential magnetic field probe is proposed, and its effectiveness is proved. Two symmetric grounded coplanar waveguide transmission lines are applied in the proposed method to solve the ABCD‐matrix of the embedded part of the calibrator. The de‐embedded S‐parameter model of the four‐port calibration system for differential magnetic field probe can be obtained. The calibration results indicate that the proposed method can also reduce the calibration ripple and compensate for the attenuation caused by the calibrator. Compared with the traditional calibration method using a microstrip line calibrator, the ripples of the proposed method can be reduced by 34%. The analysis results of the frequency interval of the ripple (FIR) in different methods show that the de‐embedding method can reduce the FIRs (except around 1.2 GHz) caused by the reflection of the calibrator and retain the FIR (about 1.2 GHz) caused by the reflection of the probe itself.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Differential magnetic field probe calibration based on symmetric de‐embedding technology

Hou,

Xue,

Ding

et al. 2023

IET Science Measure & Tech

View full text Add to dashboard Cite

show abstract

“…Near‐field measurement 1–8 are widely applied to electromagnetic (EM) interference analysis, 9–11 reconstruction of equivalent emission sources, 12,13 faults location, 13,14 shielding analysis, 15 radio frequency (RF) current and voltage measurement, 16,17 and so forth. The near‐field probe is a key tool for near‐field measurement, so the design and characterization of the probe are essential for the above applications 1–3,18–28 …”

Section: Introductionmentioning

confidence: 99%

“…The near-field probe is a key tool for near-field measurement, so the design and characterization of the probe are essential for the above applications. [1][2][3][18][19][20][21][22][23][24][25][26][27][28] The dual probe, which can detect the electric field (E-field) and magnetic field (H-field) simultaneously at the same location, 25,29,30 has the advantages of high efficiency in near-field scanning, and has less influence on the measured signals than that of the shielded loop probe. These advantages make the dual probe very suitable for…”

mentioning

confidence: 99%

De‐embedding calibration for an electromagnetic dual probe using GCPW

Li,

Shao,

Tian

et al. 2023

Micro & Optical Tech Letters

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An ultrawideband de‐embedding calibration method (DCM) for a dual probe is proposed in this paper. Different from the conventional calibration method (CCM), in which a microstrip calibrator and the dual probe form a three‐port calibration network, the proposed calibration system is a four‐port network. By using two different lengths of grounded coplanar waveguide (GCPW) calibrators, namely line‐kit and through‐kit, the de‐embedded ‐parameter model of the calibration network is obtained. Measured results show that the ripple of the DCM with GCPW reduced by 59% of the CCM with the microstrip calibrator, and the phase delay has been almost compensated. In addition, the proposed method reduces the attenuation by approximately 0.7 dB at 10 GHz and 1.15 dB at 20 GHz. The calibration results indicate that the working frequency of the DCM is up to 22 GHz.

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“…The loop antenna is used as a near-field probe [1][2][3], coaxial cable is used to design the near-field probe [4][5][6][7][8], the near-field probe with shield loop is manufactured by printed circuit board (PCB) technology [9][10][11][12], low temperature co-fired ceramic (LTCC) technology is used to design the high performance near-field probe [13,14] and the Thin-film technique is used to design the high spatial resolution near-field probe [15]. Nowadays, near-field probes have been widely used in electromagnetic interference (EMI) detection of large-scale integrated circuits (IC) [16][17][18][19], EMI source location of high-speed PCB [20][21][22][23], near-field electromagnetic shielding characteristic analysis of materials, cryptographic chip electromagnetic security analysis [24] and fault diagnosis of circuit structures [25].…”

Section: Introductionmentioning

confidence: 99%

Design and characterisation of a dual probe with double‐loop structure for simultaneous near‐field measurement

Chen

Tian

et al. 2022

IET Microwaves Antenna & Prop

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In this study, a near-field dual probe with a double-loop structure is designed and characterised. The high-performance, low-loss Rogers material and four-layer printed circuit board are applied to design the double detection loop structure, which increases the detection area and effectively improves the frequency response of the probe. The key parameters of the probe, including the frequency response, calibration factor, sensitivity, spatial resolution, isolation and differential electric field suppression are characterised by a microstrip line. Compared with other dual probes, the proposed probe has better frequency response and higher sensitivity. The magnetic field sensitivity is −90.88 dB A/m/ ffi ffi ffi ffi ffi ffi Hz p and the electric field sensitivity is −46.89 dB A/m/ ffi ffi ffi ffi ffi ffi Hz p at 1 GHz.This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.

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Miniature Active Differential Magnetic Field Probe With High Sensitivity for Near-Field Measurements

Cited by 40 publications

References 19 publications

Differential magnetic field probe calibration based on symmetric de‐embedding technology

Differential magnetic field probe calibration based on symmetric de‐embedding technology

De‐embedding calibration for an electromagnetic dual probe using GCPW

Design and characterisation of a dual probe with double‐loop structure for simultaneous near‐field measurement

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