CaxZn(1-x)Al2O4(x= 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+by Ca2+in ZnAl2O4thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. TheCaxZn1-xAl2O4thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constantεrand unloaded quality factorQuusing LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4possessesεr~10.41andQu~5770which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.