2004
DOI: 10.1016/j.tcs.2003.11.018
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Minimal length test vectors for multiple-fault detection

Abstract: A methodology for circuit testing is proposed for detecting multiple circuit faults in the course of a minimal length "guided tour" of the circuit transition structure. Deriving a test vector to guide this tour through an n state subsystem with at most I inputs possible in situ at each state, corresponds to solving an open tour multigraph version of the "Chinese Postman" problem, in which out-degrees are bounded by I . In this case, the length L of a minimal length open tour is shown to satisfy L 6 In 2 ; a mi… Show more

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Cited by 2 publications
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