Minimum detection limits and applications of proton and helium induced X-ray emission using transition-edge sensor array

Abstract

We have determined minimum detection limits, MDLs, for elements 14 ≤ Z ≤ 86 using a transition-edge sensor array, TES array, and as a comparison using an Amptek X-123SDD silicon drift detector, SDD. This was done using a 3 MeV proton beam and a 5.1 MeV helium beam. MDLs were determined for a thin film sample on top of C substrate, and for a bulk sample containing mostly Al. Due to the smaller peak-to-background ratio, lower detection limits were obtainable using the TES array for most of the elements. However, for elements 30 ≤ Z ≤ 45 the performance of the TES array was not as good as the SDD performance. This is due to the limitations of the TES used at energies > 10 keV. The greatest advantage of TES comes, however, when detecting low intensity peaks close to high intensity peaks. Such a case was demonstrated by measuring a fly ash with overlapping Ti, V, Ba, and Ce peaks, where minimum detection limits of V, Ba, and Ce were decreased by factor of 620, 400, and 680, respectively compared to the SDD.

Heavy ion induced Ti X‐ray satellite structure for Ti, TiN, and TiO2 thin films

“…It is known that the TES gain drifts during the measurements, and it can be corrected . The used drift correction algorithm is designed for narrow X‐ray lines, not for complicated and wide X‐ray satellite structures, and thus, it is unable to correct the systematic error in gain. For this reason, the observed peak position shifts are believed to be caused by the natural TES gain drift.…”

GGR Biennial Critical Review: Analytical Developments Since 2014

“…() and Käyhkö et al . () both demonstrated the advantages of using a superconducting microcalorimeter array operated at 0.1 K as detector for PIXE. This unique instrument for elemental analysis combines the best aspects of ED and wavelength dispersive (WD) spectrometers.…”