Mitigating Potential-Induced Degradation (PID) Using SiO2 ARC Layer

2022

Preprint

Self Cite

Photovoltaic systems can be affected by different types of defects, faults, and mismatching conditions. In the last couple of years, the PV industry caught upon a severe problem in PV systems, so-called potential induced degradation (PID). The PID appears over time (months or even years); it may be undetectable at an early installation stage of the PV system. However, over time, it becomes apparent as it might lead to a significant drop in the output power. This paper conducts a field study of PV modules affected by PID over two successive years. With the support of thermal and electroluminescent imaging, the PID was discovered. Furthermore, it was found that the PID emerged in the PV modules after being in the field of different timing 4 to 8 months and led to a drop in the output power in the range of 27–39%. An anti-PID box was fitted during the second year of the PV operation to recover the PID. Accordingly, it has stabilized the power degradation, but it could not restore the performance of the affected PID as compared with healthy/non-PID modules.

Section: Introductionmentioning

confidence: 93%

Filed Study on the Severity of Photovoltaic Potential Induced Degradation

Badran

2022

Preprint

Self Cite

“…The PID affected module's shunt resistance (parallel resistance) is reduced, resulting in an open-circuit voltage drop. This can also be exemplified by the cells' shunting (blackout/dark) when EL images are captured 19 – 21 .…”

Section: Introductionmentioning

confidence: 94%

Field study on the severity of photovoltaic potential induced degradation

Badran

2022

Sci Rep

Self Cite

Photovoltaic (PV) systems can be affected by different types of defects, faults, and mismatching conditions. A severe problem in PV systems has arisen in the last couple of years, known as potential-induced degradation (PID). During the early installation stage of the PV system, the PID may not be noticed because it appears over time (months or years). As time passes, it becomes more apparent since the output power may drop dramatically. We studied PV modules over the course of three years that were affected by PID. An electroluminescent and thermal imaging technique helped discover the PID. PID appeared in PV modules after being in different fields for 4–8 months, resulting in a 27–39% drop in power. An anti-PID box was fitted during the second year of the PV operation to recover the PID. Accordingly, it has stabilized the power degradation, but it could not restore the performance of the affected PID modules as compared with healthy/non-PID modules.

“…where is the Boltzmann's constant, is the elementary charge value, and is the temperature in degrees Kelvin. Commercial or even lab-based solar cells typically have a above 500 mV [16], [24].…”

Section: A Solar Cell Parametersmentioning

confidence: 99%

“…The represents the amount of current density that flows through the external circuit when the electrodes of the cell are short-circuited and depends on the photon flux incident on the TII-21-0994 surface of the cell. Hypothetically, the value for crystalline silicon solar cells is above 30 mA/cm 2 [24]. This value can be determined from the one-diode model as in (2).…”

Section: A Solar Cell Parametersmentioning

confidence: 99%

Investigating the Impact of Cracks on Solar Cells Performance: Analysis Based on Nonuniform and Uniform Crack Distributions

d’Alessandro

Daliento

2022

IEEE Trans. Ind. Inf.

Self Cite

The paper investigates the detrimental effect of nonuniform and uniform crack distributions over a solar cell in terms of open-circuit voltage ( ), short-circuit current density ( ), and output power, the latter under a wide range of irradiance conditions. The experimental procedure to detect the cracks relies on electroluminescence imaging, which is nondestructive and requires a relatively low amount of time. The Griddler software is adopted to translate the EL-taken image into and maps. The main findings can be summarized as follows: (i) the nonuniformly-and uniformly-cracked cells are both jeopardized in terms of output power; (ii) the loss corresponding to the cell with nonuniform distribution of cracks is increasingly higher than the uniformly-cracked counterpart as the irradiance hitting the cells grows, and (iii) all cells affected by nonuniform cracks are severely damaged in terms of fingers and rear busbar, which concur to limit the maximum output current.