2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 2015
DOI: 10.1109/ceidp.2015.7352017
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Mixed Weibull distribution model of DC dielectric breakdowns with dual defect modes

Abstract: This work provides physical insight into common statistical models for DC dielectric breakdown field strengths. Voltage step-up tests were performed on low density polyethylene films. The merits of generalizations to widely-used empirical Weibull models are discussed. The cumulative probability distributions of the breakdown fields were fit to standard two-and three-parameter Weibull distributions. Mixed two-parameter Weibull distributions, sometimes used in the literature to model multiple breakdown modes, we… Show more

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Cited by 12 publications
(7 citation statements)
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“… Breakdown is not well characterized by as single number. Consider a probability distribution that depends not only on the material, but the conditions it is subjected to over time [13,17]. The acceptable probability need to be determined by considering mission objectives and tolerances.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“… Breakdown is not well characterized by as single number. Consider a probability distribution that depends not only on the material, but the conditions it is subjected to over time [13,17]. The acceptable probability need to be determined by considering mission objectives and tolerances.…”
Section: Resultsmentioning
confidence: 99%
“… Physics-based or even well-chosen empirical models can estimate behaviour of materials for times and conditions not achievable with testing [13,17].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Although the analysis presented above is entirely empirical, we offer here a plausible physical context [2,4,17]. Consider low-energy physical defects such as bond bending.…”
Section: Discussionmentioning
confidence: 99%
“…The results indicate that the mixed Weibull distribution model has a higher accuracy compared with other methods. Andersen and Dennison [6] developed a mixed Weibull Distribution Model of DC Dielectric Breakdown failures, as these failures incorporate both low-and high-energy defect modes. Ghavijorbozeh and Hamadani [7] applied the mixed Weibull distribution in the machine reliability analysis for the Cellular manufacturing system.…”
Section: Introductionmentioning
confidence: 99%