2012 IEEE International Energy Conference and Exhibition (ENERGYCON) 2012
DOI: 10.1109/energycon.2012.6348290
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Model-based design process for product development of substation IEDs

Abstract: The conventional process of developing protection algorithms for substation Intelligent Electronic Devices (IEDs) follows a V-development model of specification, design, coding, unit testing, integration, verification and validation. The code is implemented manually and is specific to a particular platform. This process is labour and time intensive, the source codes may also need to be rewritten or modified when a new platform is developed. Moreover, with the increased complexity of the protection algorithms, … Show more

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Cited by 4 publications
(2 citation statements)
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“…As an example, the development of a controller for a low power singlephase transformerless inverter was presented. The development, verification, and implementation stages of automatic code generation to implement over/under-power protection functions and MATLAB/Simulink active power filter control blocks are given in [4] and [5], respectively. The active power filter allows the rapid on-line tuning of the filter's parameters, selection of control algorithms, and can be applied to generate code for microcontrollers.…”
Section: Modelling Input Test Signals and Defining Reference Responsementioning
confidence: 99%
See 1 more Smart Citation
“…As an example, the development of a controller for a low power singlephase transformerless inverter was presented. The development, verification, and implementation stages of automatic code generation to implement over/under-power protection functions and MATLAB/Simulink active power filter control blocks are given in [4] and [5], respectively. The active power filter allows the rapid on-line tuning of the filter's parameters, selection of control algorithms, and can be applied to generate code for microcontrollers.…”
Section: Modelling Input Test Signals and Defining Reference Responsementioning
confidence: 99%
“…and P x is the x-th percentile of the values of P inst logged during a specified time interval, where x is 0.1, 0.7, 1, 1.5, 2.2, 3,4,6,8,10,13,17,30,50,80. The interval can vary from 1 to 15 m, however, the EN 61000-4-30 standard assumes 10 m for a typical flicker severity evaluation.…”
Section: Flicker Implementationmentioning
confidence: 99%