2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops 2011
DOI: 10.1109/icstw.2011.11
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Model Based Statistical Testing of Embedded Systems

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Cited by 18 publications
(8 citation statements)
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“…A DDSPN, or usage net [2], reflects all possible uses of the SUT. Any state space explosion resulting from concurrent streams of use is hidden in a DDSPN.…”
Section: Related Workmentioning
confidence: 99%
“…A DDSPN, or usage net [2], reflects all possible uses of the SUT. Any state space explosion resulting from concurrent streams of use is hidden in a DDSPN.…”
Section: Related Workmentioning
confidence: 99%
“…Recent studies of Bohr [11], [14] take the timing behavior and concurrency into account for model-based statistical testing of embedded systems. Petri nets are used for specifying SUT models [14] and oracles are automatically generated to enforce timing requirements [11].…”
Section: Related Workmentioning
confidence: 99%
“…Petri nets are used for specifying SUT models [14] and oracles are automatically generated to enforce timing requirements [11]. The generated test cases reflect the timed and concurrent nature of inputs for SUT.…”
Section: Related Workmentioning
confidence: 99%
“…This model (an automaton labeled with probabilities [16]) can be traversed to generate realistic SUT inputs. Recent extensions of MBST [17] targets embedded systems by taking time and concurrency into account via the use of Petri-nets. Test input generation is not the primary objective when setting-up a faithful usage model, and can only generate a finite set of Boolean signals.…”
Section: Related Workmentioning
confidence: 99%