2008 32nd Annual IEEE International Computer Software and Applications Conference 2008
DOI: 10.1109/compsac.2008.156
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Model Driven Development Challenges in the Automation Domain

Abstract: Model driven development has evolved to a mature methodology and technology usable for some industrial settings. Within the automation domain it is an upcoming approach. This paper addresses challenges present in the automation domain when it comes to the usage of model driven development. Quality, life cycle, legacy systems, mental approach and safety challenges are briefly discussed.

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Cited by 15 publications
(15 citation statements)
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“…Therefore the acquisition of competencies and expertise is a major driver for the successful implementation of MDD. However the acquisition of competencies and expertise in the context of MDD is a cumbersome process due to the significant technological threshold and steep learning curve involved, and the lack of expertise available on the labour market (Rios et al 2006, Hailpern and Tarr 2006, France and Rumpe 2007, Streitferdt et al 2008, Teppola et al 2009, Straeten et al 2009, Kolovos et al 2009, Mohagheghi et al 2009, Lauder et al 2010).…”
Section: O2 Acquisition Of Competencies and Expertisementioning
confidence: 99%
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“…Therefore the acquisition of competencies and expertise is a major driver for the successful implementation of MDD. However the acquisition of competencies and expertise in the context of MDD is a cumbersome process due to the significant technological threshold and steep learning curve involved, and the lack of expertise available on the labour market (Rios et al 2006, Hailpern and Tarr 2006, France and Rumpe 2007, Streitferdt et al 2008, Teppola et al 2009, Straeten et al 2009, Kolovos et al 2009, Mohagheghi et al 2009, Lauder et al 2010).…”
Section: O2 Acquisition Of Competencies and Expertisementioning
confidence: 99%
“…to think in terms of models, to be knowledgeable on the problem domain, etc.) and the heavy reliance on computer-based technologies to transform models into running systems (Rios et al 2006, France and Rumpe 2007, Chunying and Kang 2007, Zhu et al 2008, Streitferdt et al 2008, Straeten et al 2009, Teppola et al 2009, Vangheluwe 2011).…”
Section: O5 Reliance On High Level Modelsmentioning
confidence: 99%
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“…Several research groups, for example, [15][16][17][18], have proposed approaches to extend IEC 61499 and overcome identified shortcoming of the standard.…”
Section: Iec 61499mentioning
confidence: 99%