1999
DOI: 10.1016/s0043-1648(99)00177-5
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Model for patterned erosion

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Cited by 91 publications
(150 citation statements)
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“…3, we report the timedependent hole depth obtained from the experimental results represented in Fig. 2b and d. The full curve confirms the theoretical model form Slikkerveer and in't Veld [14], which only takes into account the primary impact of particles. …”
Section: Powder Blasting Erosion Processsupporting
confidence: 73%
See 1 more Smart Citation
“…3, we report the timedependent hole depth obtained from the experimental results represented in Fig. 2b and d. The full curve confirms the theoretical model form Slikkerveer and in't Veld [14], which only takes into account the primary impact of particles. …”
Section: Powder Blasting Erosion Processsupporting
confidence: 73%
“…When the glass wafer is covered by an erosion-resistant polymer mask, containing a circular aperture, the hole eroded in the glass has a rounded shape originating from the reduced normal impact of the particles near the mask edge [14,15]. The essential role of the secondary particle impact can be illustrated by positioning the mask aperture at the edge of the substrate, as shown in Fig.…”
Section: Powder Blasting Erosion Processmentioning
confidence: 99%
“…Masking methods Chemical texturing [46,79,154,192] Electrochemical texturing [58,229] Non-masking methods Self-assembling [25,46,120,211] Maskless laser assisted etching [161] Maskless electrochemical texturing [46,195] Anisotropic etching [94,183] Mechanical CNC ultrasonic machining [46] Mechanical honing [16,146] Grinding [174] Free abrasive machining [70,224] Microcutting [28,46,70,83,225] Patterned erosion [1,205] Fig. 17.…”
Section: Chemical Conversion Coatingsmentioning
confidence: 99%
“…Analytical modeling of the surface evolution of features machined using AJM in masked glass substrates was pioneered by ten Thije Boonkkamp and Jansen [1] and Slikkerveer et al [8]. In these models, the local surface velocity was related to the local surface slope, the erosion rate of the target, and the particle velocity and flux of the arriving particles.…”
Section: Previous Modeling Effortsmentioning
confidence: 99%