2009
DOI: 10.1109/temc.2009.2026637
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Modeling and Analysis of Simultaneous Switching Noise Coupling for a CMOS Negative-Feedback Operational Amplifier in System-in-Package

Abstract: Abstract-A new hybrid modeling method is proposed for the chip-package comodeling and coanalysis. This method is designed to investigate the simultaneous switching noise (SSN) coupling paths and effects on the dc output voltage offset of the operational amplifier (OpAmp). It combines an analytical model of the circuit with a power distributed network (PDN) and interconnection models at the chip and package substrate. In order to validate the proposed model, CMOS OpAmp was fabricated using TSMC 0.25 µm. Then th… Show more

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Cited by 19 publications
(5 citation statements)
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“…is type of noise degrades the circuit performance and makes system sensitivity dominated. It can directly be transmitted to an active circuit via the substrate; therefore, the signal and power are corrupted, the system reliability is reduced, and the bit error rate is increased [21,22]. A TSV is composed of a conductor surrounded by an insulation layer with a very small thickness, which causes an important capacitance between the TSV and the substrate; as a consequence, at high frequencies, a noise can be easily coupled from one TSV to another or substrate and vice versa.…”
Section: Tsv-tsv and Tsv-active Circuit Noise Couplingmentioning
confidence: 99%
“…is type of noise degrades the circuit performance and makes system sensitivity dominated. It can directly be transmitted to an active circuit via the substrate; therefore, the signal and power are corrupted, the system reliability is reduced, and the bit error rate is increased [21,22]. A TSV is composed of a conductor surrounded by an insulation layer with a very small thickness, which causes an important capacitance between the TSV and the substrate; as a consequence, at high frequencies, a noise can be easily coupled from one TSV to another or substrate and vice versa.…”
Section: Tsv-tsv and Tsv-active Circuit Noise Couplingmentioning
confidence: 99%
“…, z ±k = exp ±j 2πkT τ , and C k = exp(ckT) τ , while τ = NT, ∀k, and z N ±k = exp(± j2πk) = 1. In Equation 12, the first and the third sum are evaluated using the FFT and IFFT algorithms, respectively, while other parts, which present the infinite sum, are used as the input data in the q-d algorithm that uses a very small number of necessary additional terms, as explained in [24]. The computing region should be chosen as:…”
Section: Calculation Of Time-domain Tsv Noise Coupling In 3d-ic Desigmentioning
confidence: 99%
“…This noise degrades system performance and makes it more sensitive. It can also be transmitted directly to an active circuit through the substrate; therefore, the signal and power are corrupted, the system reliability is reduced, and the bit error rate is increased [24,25].…”
Section: Introductionmentioning
confidence: 99%
“…Power/ground noise, such as simultaneous switching noise (SSN), is a major concern in high-speed circuit designs for achieving high performance and high reliability of electronic systems. As the number of transistors and power consumption of a very large-scale integration (VLSI) increases significantly, power/ground noise severely affects the overall system performance [1][2][3][4]. The power/ground noise produces the problem of glitches, timing push-out of digital signals, and power-supply voltage fluctuations.…”
Section: Introductionmentioning
confidence: 99%