2018 SICE International Symposium on Control Systems (SICE ISCS) 2018
DOI: 10.23919/siceiscs.2018.8330172
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Modeling and localized feedforward control of thermal deformations induced by a moving heat load

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Cited by 8 publications
(11 citation statements)
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“…Note that it is often much easier to compute T pass ðx, tÞ and u pass ðx, tÞ resulting from Q pass ðx, tÞ than the solution u X, 1 ðx, tÞ resulting from Q X, 1 ðx, tÞ because u pass ðx, tÞ typically needs to be computed over a smaller time window and requires a mesh of a smaller part of the spatial domain than u X, 1 ðx, tÞ: This makes the construction of T X, 1 ðx, tÞ and u X, 1 ðx, tÞ through (19) and (22) attractive in many applications such as the wafer heating problem considered in Section 5.…”
Section: Repetitive Heat Sourcesmentioning
confidence: 99%
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“…Note that it is often much easier to compute T pass ðx, tÞ and u pass ðx, tÞ resulting from Q pass ðx, tÞ than the solution u X, 1 ðx, tÞ resulting from Q X, 1 ðx, tÞ because u pass ðx, tÞ typically needs to be computed over a smaller time window and requires a mesh of a smaller part of the spatial domain than u X, 1 ðx, tÞ: This makes the construction of T X, 1 ðx, tÞ and u X, 1 ðx, tÞ through (19) and (22) attractive in many applications such as the wafer heating problem considered in Section 5.…”
Section: Repetitive Heat Sourcesmentioning
confidence: 99%
“…In this application, a thin silicon disk, called the wafer, is exposed to a light source which creates a pattern of electronic connections (see Figure 1). Because the wafer is thin, a 2-D plane-stress model is used, just as in [11,19]. The temperature field T D ðx, tÞ and the displacement field u D ðx, tÞ resulting from the heat load Q D ðx, tÞ are thus solutions of (1) with BCs (6), where…”
Section: Wafer Heatingmentioning
confidence: 99%
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