2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS) 2020
DOI: 10.1109/nems50311.2020.9265618
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Modeling and Simulation of MEMS Capacitive Displacement Sensors

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“…Due to process error, residual stress, and environmental stress, the values of the two sensitive capacitors cannot be perfectly equal [ 9 , 10 ]. It can cause mismatch of sensitive capacitance in a micro-accelerometer, which would deteriorate the bias and linearity [ 11 , 12 ].…”
Section: Introductionmentioning
confidence: 99%
“…Due to process error, residual stress, and environmental stress, the values of the two sensitive capacitors cannot be perfectly equal [ 9 , 10 ]. It can cause mismatch of sensitive capacitance in a micro-accelerometer, which would deteriorate the bias and linearity [ 11 , 12 ].…”
Section: Introductionmentioning
confidence: 99%