2018
DOI: 10.1007/s10470-018-1310-6
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Modeling and sizing of non-linear CMOS analog circuits used in mixed signal systems

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Cited by 3 publications
(3 citation statements)
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“…They are widely using laser and microwave-type annealing of infused dopants. These types of annealing are also widely used for the annealing of radiation defects generated during ion implantation [9][10][11][12][13][14][15][16][17]. Using these approaches gives the possibility of increasing the integration rate of elements in integrated circuits through the inhomogeneity of technological parameters generated by the inhomogenous distribution of temperature.…”
Section: Introductionmentioning
confidence: 99%
“…They are widely using laser and microwave-type annealing of infused dopants. These types of annealing are also widely used for the annealing of radiation defects generated during ion implantation [9][10][11][12][13][14][15][16][17]. Using these approaches gives the possibility of increasing the integration rate of elements in integrated circuits through the inhomogeneity of technological parameters generated by the inhomogenous distribution of temperature.…”
Section: Introductionmentioning
confidence: 99%
“…They are widely using laser and microwave types of annealing of infused dopants. These types of annealing are also widely using for annealing of radiation defects, generated during ion implantation [9][10][11][12][13][14][15][16][17]. Using the approaches gives a possibility to increase integration rate of elements of integrated circuits through inhomogeneity of technological parameters due to generating inhomogenous distribution of temperature.…”
Section: Introductionmentioning
confidence: 99%
“…At present, several significant problems in solid-state electronics, such as increasing the performance, reliability and density of integrated circuit elements (diodes, field-effect and bipolar transistors), are intensively addressed [1][2][3][4][5][6]. To increase the performance of these devices, there is a growing interest in identifying materials with higher values of charge carrier mobility [7]- [10].…”
Section: Introductionmentioning
confidence: 99%