Modeling cluster formation driven variations in critical electric field of He and Xe near critical point based on electron scattering cross sections

Abstract

The dielectric breakdown strength of supercritical He and supercritical Xe shows a steep decline near the critical point due to density fluctuation caused by cluster formation. Conventional gas discharge theories are limited in explaining the drastic dielectric strength variation of He and Xe near the critical point. In this study, a dielectric strength modeling approach that is based on the derived cross section data of clusters is utilized to estimate the dielectric strength decline of He and Xe near the critical point. The electron scattering cross section data of He and Xe clusters are derived from those of gaseous He and Xe. Based on the derived electron scattering cross section data, critical electric fields of various He and Xe clusters are modeled as a function of pressure by solving the Boltzmann equation. The proposed modeling approach shows close agreement with the experimentally measured breakdown electrical fields reported in the literature.