2017
DOI: 10.1149/2.1141702jes
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Modeling Cyclic Capacitive Loading of Thin-Film Batteries

Abstract: Previous modeling of thin-film batteries has primarily looked at simple discharge loads. This work examines modeling of midfrequency dynamic loads with large variation in current during repetitive loading cycles, a type of loading that is very common in microelectromechanical system (MEMS) applications. Here we show an extension of traditional modeling of thin-film batteries to account for switching and capacitive loading representing piezoelectric or electrostatic microactuation. This model captures behavior … Show more

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Cited by 4 publications
(2 citation statements)
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“…This suggests that the spacecharge layers in this particular ASSB do not have a large influence on the static (DC) discharge curves and, thus, on the overall performance, which has also been concluded by others [26,42]. However, this might be different for ASSB that are used in, for example, applications in which mid-to-high frequency dynamic loads are applied, such as microelectromechanical systems (MEMS) [16].…”
Section: Impedance Simulationssupporting
confidence: 64%
See 1 more Smart Citation
“…This suggests that the spacecharge layers in this particular ASSB do not have a large influence on the static (DC) discharge curves and, thus, on the overall performance, which has also been concluded by others [26,42]. However, this might be different for ASSB that are used in, for example, applications in which mid-to-high frequency dynamic loads are applied, such as microelectromechanical systems (MEMS) [16].…”
Section: Impedance Simulationssupporting
confidence: 64%
“…Earlier work on electrochemical ASSB modelling has been performed, in which moderately good agreement between the measurements and simulations has been reported [11,12]. Based on this work, where usually only DC (dis)charges profiles are applied, modelling efforts have also been performed in which highly dynamic battery loads were applied [16]. These dynamic load profiles are very common in microelectromechanical systems (MEMS) [17].…”
Section: Introductionmentioning
confidence: 97%