Modeling of a short-term stability measuring system of quartz crystal resonators

Abstract

A new numerical model of a short-term stability measuring system of quartz crystal resonators is presented. It is based on the phase bridge method using a pair of resonators driven by a low-noise source. The output signal, obtained with a phase detector, is proportional to the phase difference introduced by the resonators. The numerical transfer function of each bridge path is given by the model. The output spectral density of the phase fluctuations is computed from these transfer functions and the numerical approximation of the low-noise source. The model was applied to third overtone, SC-cut, 10 MHz BVA quartz crystal resonators. It enables the rejection of the source noise versus the resonant frequency of quartz crystal resonators to be quantified.