Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced Readout Architecture

Allinger, Kim; Bahr, Andreas; Kuhl, Matthias

doi:10.1109/tcsi.2023.3339224

IEEE Trans. Circuits Syst. I

2024

DOI: 10.1109/tcsi.2023.3339224

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Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced Readout Architecture

Kim Allinger,

Andreas Bahr,

Matthias Kuhl

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Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced Readout Architecture

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References 21 publications

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