“…Thus, to the ohmic (prebreakdown) region of I-V characteristic can be match Region 1 of C-V characteristic where capacitance varies only slightly with increasing voltage, the low-nonlinear (prebreakdown) region -Region 2 (increased capacitance) and the beginning of the highly nonlinear (breakdown) region -Region 3 (drop size). This link shows the generality of electronic processes that are responsible for the analyzed field effects and thus, the dependence of the dielectric constant (or capacitance), which are observed, can be interpreted in terms of models known for I-V characteristics (Kvaskov, 1988;Gupta, 1990;Clarke, 1999;Tonkoshkur and Ivanchenko, 2014).…”