2001
DOI: 10.1016/s0038-1101(01)00193-9
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Modeling of SiGe-base heterojunction bipolar transistor with gaussian doping distribution

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Cited by 11 publications
(4 citation statements)
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“…In further considerations material parameters are defined as follows. Intrinsic carrier concentration in the SiGe base is given as [4]:…”
Section: Modelmentioning
confidence: 99%
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“…In further considerations material parameters are defined as follows. Intrinsic carrier concentration in the SiGe base is given as [4]:…”
Section: Modelmentioning
confidence: 99%
“…where: n i0Si -intrinsic carrier concentration in pure silicon, ∆E GEFF -the effective band gap narrowing in the base due to the presence of Ge (∆E GGe ) and due to heavy doping effects (∆E GAPP ). It is assumed that band gap depends linearly on y Ge (7.5 meV per 1% of Ge, e.g., [4]). The model of Klaassen-Slotboom-de Graaff [5] was chosen to describe ∆E GAPP .…”
Section: Modelmentioning
confidence: 99%
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