Modeling of the Optical and Electrical Degradation of 845 nm VCSILs

Buffolo, Matteo; Zenari, Michele; Fornasier, Mirko; Santi, Carlo De; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan S.; Kumari, Sulakshna; Stassen, Andim; Morthier, Geert; Baets, Roel; Larsson, Anders; Roelkens, Günther; Meneghesso, G.; Zanoni, Enrico; Meneghini, Matteo

doi:10.1364/cleo_si.2023.sf2q.8

Cleo 2023 2023

DOI: 10.1364/cleo_si.2023.sf2q.8

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Modeling of the Optical and Electrical Degradation of 845 nm VCSILs

Matteo Buffolo¹,

Michele Zenari²,

Mirko Fornasier³

et al.

Abstract: Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.

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Modeling of the Optical and Electrical Degradation of 845 nm VCSILs

Abstract: Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.

Cited by 0 publications

References 1 publication

No citations

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