2007
DOI: 10.5194/ars-5-413-2007
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Modellierung des elektrischen Feldes für Anordnungen mit Singularitäten

Abstract: Abstract. Modern numerical methods for field calculations are having problems dealing with singularities correctly. This paper provides two alternative methods that are able to handle electric fields including singularities in tip-like configurations. These configurations occur in atomic force microscopes. Another focus will be the suitability of coupling the presented methods with usual numerical methods.

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(3 citation statements)
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“…A consideration of the radius of the surfaces with simultaneous translation of the slot model to the correct radius does not lead to an improvement of the accuracy of the results. In Reference [21], the influence of the numbers of charges and of receptor points and their positions on the quality of the solution is analyzed. A larger number of charges and contour points increase the accuracy of the calculation.…”
Section: Discussionmentioning
confidence: 99%
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“…A consideration of the radius of the surfaces with simultaneous translation of the slot model to the correct radius does not lead to an improvement of the accuracy of the results. In Reference [21], the influence of the numbers of charges and of receptor points and their positions on the quality of the solution is analyzed. A larger number of charges and contour points increase the accuracy of the calculation.…”
Section: Discussionmentioning
confidence: 99%
“…In addition, a larger number of contour points than charges can increase the accuracy of the solution. To improve the condition of the coefficient matrix A, it is recommended in Reference [21] to place the zero point of the coordinate system near the arrangement. Also, a small distance between a charge and the corresponding receptor point can enhance the condition of the coefficient matrix.…”
Section: Discussionmentioning
confidence: 99%
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