2015
DOI: 10.7305/automatika.2015.12.768
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Modelling and detection of failure in medical electrodes

Abstract: In this paper we have studied the failures in medical electrodes such as electroencephalogram electrodes (EEG) being used for collecting brain signals. As those electrodes have to guarantee high level of reliability it is important to explore and predict the possible occurrence of failures in there structure. The electrode tip (needle) made of stainless steel is covered with thin oxide film acting as a dielectric and determing the total electrode resistance. In fact, studying the fluctuations of that resistanc… Show more

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Cited by 1 publication
(2 citation statements)
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“…The developed computer model has been applied in [27]. It is known from the literature that the resistance fluctuations can be characterized as a superposition of the flicker and white noise [3,6]. Noise-to-noise and signal-to-noise ratios are determined using the average signal energy and average global entropy of the measured signal spectrograms.…”
Section: Criteria Application On Simulated Datamentioning
confidence: 99%
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“…The developed computer model has been applied in [27]. It is known from the literature that the resistance fluctuations can be characterized as a superposition of the flicker and white noise [3,6]. Noise-to-noise and signal-to-noise ratios are determined using the average signal energy and average global entropy of the measured signal spectrograms.…”
Section: Criteria Application On Simulated Datamentioning
confidence: 99%
“…In many cases, failure of electronic devices can be caused by degradation (electromigration or oxidization) of metallic interconnects and solder joints which lose their conduction properties. Some known failure detection methods are based on the research of DC resistance fluctuations, material fatigue, corrosion, and mechanical stress [1][2][3]. Researching solely resistance fluctuations of the material has proven to be unreliable for determining failure appearance as shown in literature that researched resistance fluctuations using *Correspondence: ivan.marasovic@fesb.hr 2 University of Split Faculty of Electrical Engineering, Mechanical Engineering and Naval Architecture, University of Split, Split, Croatia Full list of author information is available at the end of the article disordered networks such as large scale random resistor network (RRN) which exploits the fact that faulty electrode presents non-Gaussian behavior and valid does not, which has not been successfully applied as a reliable discrimination criteria [3].…”
Section: Introductionmentioning
confidence: 99%