The origin of defects present in a device is not always clear. Hence, in electronic device simulation, the influence of defects with more than two different charge states ͑multivalent defects͒ is often modeled as a set of defects with only two possible charge states ͓Shockley-Read-Hall ͑SRH͒-like defects͔ which follow the SRH statistics. This paper investigates under which circumstances this procedure is allowed, and provides means to check the equivalence between the multivalent and SRH-like description in a fast and efficient way. The procedures are verified simulating a thin film solar cell structure.