Modelling the effect of vacuum on the morphology for large format detector arrays

Abstract

Rapid growth in the size and performance of the detector arrays unavoidably faced the morphology concern which was susceptible to peripheral exertions. Ex-situ interferometer characterization was carried out to modelling the effect of vacuum on the morphology whose results, in turn, was used to build the ANSYS model. The modelled total deformation explained the physical phenomena very well.