Modelling the pin gap effect in coaxial connectors

Zhu, Qian; Ji, Yu

doi:10.1109/cpem.2012.6250682

Cited by 4 publications

(2 citation statements)

References 4 publications

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“…The most dominant defect is the so‐called pin gap, which results from individual mechanical tolerances of connectors and presents a gap in the contact plane of the inner conductors. The reactive effect due to evanescent modes excited near the step‐discontinuities may be represented using a shunt susceptance (

j b

), given by an empirical formula as a function of the dimensional parameters and frequency

b \approx true(- 13.58 {true(\frac{a_{1}}{a_{2}} true)}^{3} + 68.30 {true(\frac{a_{1}}{a_{2}} true)}^{2} - 128.03 true(\frac{a_{1}}{a_{2}} true) + 73.31 true) g f,

where the dimensional variables are given as shown in Figure and

f

is the frequency in GHz. The corresponding cascading matrix is

R_{b} = true[\begin{matrix} 1 - j \frac{b}{2} & - j \frac{b}{2} \\ j \frac{b}{2} & 1 + j \frac{b}{2} \end{matrix} true] .

…”

Section: Circuit Modelmentioning

confidence: 99%

“…Until now, major focus has been on connector repeatability and statistical models have been used . Only few attempts have dealt with the systematic errors caused by imperfect connectors , where the pin gap effect (being the most noticeable connector defect) was considered. Meanwhile, the time domain technique is well known for diagnostic studies of microwave networks, via either (1) direct time domain reflectometry or (2) transformation of frequency domain data measured on a vector network analyzer (VNA) .…”

Section: Introductionmentioning

confidence: 99%

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