2011
DOI: 10.1007/s10825-011-0367-6
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Models for numerical device simulations of crystalline silicon solar cells—a review

Abstract: Current issues of numerical modeling of crystalline silicon solar cells are reviewed. Numerical modeling has been applied to Si solar cells since the early days of computer modeling and has recently become widely used in the photovoltaics (PV) industry. Simulations are used to analyze fabricated cells and to predict effects due to device changes. Hence, they may accelerate cell optimization and provide quantitative data e.g. of potentially possible improvements, which may form a base for the decision making on… Show more

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Cited by 265 publications
(127 citation statements)
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References 127 publications
(140 reference statements)
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“…The experimental high-injection value for C A differs from C n + C p measured at low injection levels 4,6 . We take the both injection regimes into account using an artificial value of 10 −30 cm 6 /s for C n .…”
Section: A Semiconductor Materials Modelcontrasting
confidence: 60%
“…The experimental high-injection value for C A differs from C n + C p measured at low injection levels 4,6 . We take the both injection regimes into account using an artificial value of 10 −30 cm 6 /s for C n .…”
Section: A Semiconductor Materials Modelcontrasting
confidence: 60%
“…53. For Si, state-of-the-art models highlighted by Altermatt 54 and the latest Auger model 54 were applied in the simulation to accurately predict silicon characteristics. For SnO 2 , the key material parameters are determined from various papers [35][36][37][38][39][40] as listed in Table 1.…”
Section: Electrical Simulationsmentioning
confidence: 99%
“…Schenk's model also accounts for BGN in the base substrate due to injected carriers, which can have a significant effect in devices and lifetime samples at high injection conditions [7]. The Schenk BGN model takes part in a collection of state-of-the-art models for (highly doped) c-Si which were chosen for use in cmd-PC1D 6.0 [3] as suggested by Altermatt et al [5] [8]. This set of models also includes Sproul and Green's model for the temperature-dependent intrinsic carrier density i,0 ( ) [9], which has been linearly scaled by a constant factor 0.9677 to match the latest value of 9.65 × 10 9 cm -3 at 300 K as reported by Altermatt et al [10], as well as the extensive and commonly used mobility model by Klaassen [11], [12].…”
Section: Fermi-dirac Statistics and Physical Models Introduced In Vermentioning
confidence: 99%