2008
DOI: 10.1142/s0218539308003222
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Models for Optimization of Production Environmental Stress Testing on Electronic Circuit Packs

Abstract: The problem of optimizing accelerated production testing is a pressing one in most electronic manufacturing facilities. Yet, practical models are scarce in the literature, especially for testing high volumes of electronic circuit packs in failure-accelerating environments. In this paper, we develop both a log-linear and linear model, based initially on the Weibull distribution. The models developed are suitable for modeling accelerated production testing data from a temperature-cycled environment. The model is… Show more

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“…Honari et al 30 developed a method of optimizing the test time using field and test data. A piecewise regression model was applied by Joyce et al 31 to temperature cycling test in order to optimize the EST.…”
Section: B Honari Et Almentioning
confidence: 99%
“…Honari et al 30 developed a method of optimizing the test time using field and test data. A piecewise regression model was applied by Joyce et al 31 to temperature cycling test in order to optimize the EST.…”
Section: B Honari Et Almentioning
confidence: 99%