Moderne Methoden Der WerkstoffprüFung 2014
DOI: 10.1002/9783527670673.ch7
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Moderne Methoden der Rasterelektronenmikroskopie

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Cited by 2 publications
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“…Overall, these results indicate the impact of incident beam diffraction effects, which also explain the extremely angular sensitivity of FSD images. The same channeling‐in effects are also responsible for the recent renaissance of electron channeling contrast imaging (ECCI) .…”
Section: Imaging By Using the Ebsd Signalmentioning
confidence: 99%
“…Overall, these results indicate the impact of incident beam diffraction effects, which also explain the extremely angular sensitivity of FSD images. The same channeling‐in effects are also responsible for the recent renaissance of electron channeling contrast imaging (ECCI) .…”
Section: Imaging By Using the Ebsd Signalmentioning
confidence: 99%
“…Fig. 2: Current density vs. electrical potential curves for CFRP and aluminum againstSilver/Silverchloride according to Biermann et al[13] …”
mentioning
confidence: 99%