2023
DOI: 10.1039/d3ta02719h
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Modification of 2D materials using MoS2as a model for investigating the Al-storage properties of diverse crystal facets

Abstract: The research on aluminum batteries (ABs) is becoming a hotspot due to their low cost, high specific capacity, and high safety. However, the limited charge-storage capacity of cathodes has impeded...

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Cited by 8 publications
(2 citation statements)
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“…The compressed semicircles are associated with electrochemical resistance, including electrolyte resistance (R e ) at the intercept of the Z′ axis and the charge transfer resistance (R ct ) between the anode and electrolyte at the middle-to-high frequency. 53 The R ct value of the CuO/MXene anode (108.4 Ω) is between those of CuO (210.1 Ω) and MXene (52.1 Ω) in the simulated equivalent circuit (Figure S9 and Table S1). It suggests that the MXene matrix enhanced the electron conductivity of the CuO/MXene heterojunction compared with pure CuO.…”
Section: Resultsmentioning
confidence: 95%
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“…The compressed semicircles are associated with electrochemical resistance, including electrolyte resistance (R e ) at the intercept of the Z′ axis and the charge transfer resistance (R ct ) between the anode and electrolyte at the middle-to-high frequency. 53 The R ct value of the CuO/MXene anode (108.4 Ω) is between those of CuO (210.1 Ω) and MXene (52.1 Ω) in the simulated equivalent circuit (Figure S9 and Table S1). It suggests that the MXene matrix enhanced the electron conductivity of the CuO/MXene heterojunction compared with pure CuO.…”
Section: Resultsmentioning
confidence: 95%
“…Figure a shows the EIS spectra of CuO/MXene, CuO NRs, and MXene anodes before cycling. The compressed semicircles are associated with electrochemical resistance, including electrolyte resistance ( R e ) at the intercept of the Z′ axis and the charge transfer resistance ( R ct ) between the anode and electrolyte at the middle-to-high frequency . The R ct value of the CuO/MXene anode (108.4 Ω) is between those of CuO (210.1 Ω) and MXene (52.1 Ω) in the simulated equivalent circuit (Figure S9 and Table S1).…”
Section: Resultsmentioning
confidence: 99%