1999
DOI: 10.1557/proc-585-91
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Modification of Thin Film Growth using Glancing-Angle Ions

Abstract: This paper reviews the use of glancing-angle ions for modifying surfaces and thin film growth processes. Ions impinging on a flat surface at oblique incidence angles are mostly reflected without penetrating, providing very low sputtering rates along with minimal damage and implantation. They also provide a unique selectivity, where ion energy is coupled to defects or rough portions of the surface, while flat portions are essentially unaffected. This allows one to clean contaminated surfaces and smoothen rough … Show more

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